A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beam
- 15 February 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 193 (1-2) , 239-243
- https://doi.org/10.1016/0029-554x(82)90703-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amountsAnalytical Chemistry, 1975
- Optical Flats for Use in X-Ray Spectrochemical MicroanalysisReview of Scientific Instruments, 1971