Standard test interface language (STIL) a new language for patterns and waveforms

23 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 565-570
https://doi.org/10.1109/test.1996.557091

Abstract

This paper presents the major features and capabilities of the new standard test interface language (STIL). A synopsis of the language, typical applications of the language, work that has been done to date, and degree of acceptance by the industry are discussed.

Keywords

STANDARDS DEVELOPMENT
CIRCUIT TESTING
MEETINGS
INTEGRATED CIRCUIT TESTING
CIRCUIT SIMULATION
DIGITAL INTEGRATED CIRCUITS
HARDWARE
DESIGN OPTIMIZATION
DISCRETE EVENT SIMULATION
ELECTRONIC MAIL

This publication has 2 references indexed in Scilit:

Development of a new standard for test
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
The Waveform and Vector Exchange Specification (WAVES)
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002