A proposal: Dynamic RAMs as particle detectors
- 1 February 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 169 (1) , 125-128
- https://doi.org/10.1016/0029-554x(80)90111-1
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The detrimental influence of stacking faults on the refresh time of MOS memoriesSolid-State Electronics, 1979
- The role of point-like and extended defects in MOS processingSurface Technology, 1979
- Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliabilityIEEE Transactions on Electron Devices, 1979
- Alpha-particle-induced soft errors in dynamic memoriesIEEE Transactions on Electron Devices, 1979
- Further remarks on the relations between statistical mechanics and quantum theory of measurementIl Nuovo Cimento B (1971-1996), 1966