Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliability
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 26 (1) , 10-16
- https://doi.org/10.1109/t-ed.1979.19371
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Measurement of carrier lifetime profiles in diffused layers of semiconductorsIEEE Transactions on Electron Devices, 1978
- Precision Measurements of the Ionization Energy and Its Temperature Variation in High Purity Silicon Radiation DetectorsIEEE Transactions on Nuclear Science, 1973
- Interpretation of surface and bulk effects using the pulsed MIS capacitorSolid-State Electronics, 1971