X-ray diffraction study of imperfections in epitaxial silicon on sapphire
- 1 November 1970
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 6 (5) , 321-328
- https://doi.org/10.1016/0040-6090(70)90082-9
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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