Trace element and surface analysis at the University of Montreal

This publication has 11 references indexed in Scilit:

• Quantitative PIXE analysis of powdered pottery samples bound in an organic matrix
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
• Time-of-flight system for profiling recoiled light elements
  Nuclear Instruments and Methods in Physics Research, 1983
• Performance of an on-demand beam excitation system for pixe analysis
  Nuclear Instruments and Methods in Physics Research, 1982
• Calibration and long-term stability of a PIXE set-up
  Nuclear Instruments and Methods, 1981
• Thin film X-ray fluorescence calibration standards
  Nuclear Instruments and Methods, 1979
• Automatic data acquisition and on-line analysis of trace element concentration in serum samples
  Nuclear Instruments and Methods, 1978
• A miniature electrostatic lens for forming MeV millibeams
  Nuclear Instruments and Methods, 1978
• The use of 6Li and 35Cl ion beams in surface analysis
  Nuclear Instruments and Methods, 1978
• Analytical application of particle induced X-ray emission
  Nuclear Instruments and Methods, 1976
• Trace element analysis of freeze-dried blood serum by proton and alpha-induced X-rays
  Nuclear Instruments and Methods, 1976