High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope

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Abstract
The high spatial resolution of a magnetic force microscope (MFM) has been studied with respect to a tip-sample separation, theoretically and experimentally. In the estimations, the MFM resolution becomes high as the separation decreases. The separation of less than 1 nm provides an advanced resolution of less than 10 nm. In the experiments, the probe of the conventional MFM cannot be allowed to come within 10∼20 nm of the sample to avoid mixing the atomic force with the magnetic force. By contrast, just-on-surface-MFM (JS-MFM), which allows for the MFM measurement at a small separation within 1 nm, can provide a detailed observation of the localized surface magnetic stray field with an advanced resolution of less than 10 nm.