Precision absolute thin film standard reference targets for Rutherford backscattering microanalysis
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3) , 721-726
- https://doi.org/10.1016/0029-554x(78)90958-8
Abstract
No abstract availableKeywords
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