Yield
- 1 January 1989
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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- Modeling of defects in integrated circuit photolithographic patternsIBM Journal of Research and Development, 1984
- Modeling of Integrated Circuit Defect SensitivitiesIBM Journal of Research and Development, 1983
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- Defect density distribution for LSI yield calculationsIEEE Transactions on Electron Devices, 1973
- Analysis on yield of integrated circuits and a new expression for the yieldElectrical Engineering in Japan, 1972
- A new look at yield of integrated circuitsProceedings of the IEEE, 1970
- Cost-size optima of monolithic integrated circuitsProceedings of the IEEE, 1964