BIDES: A BIST design expert system
- 1 June 1991
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 2 (2) , 165-179
- https://doi.org/10.1007/bf00133501
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- On hardware overhead in CMOS BIST designsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Automatic insertion of BIST hardware using VHDLPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- On using signature registers as pseudorandom pattern generators in built-in self-testingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- The TMS320 family of digital signal processorsProceedings of the IEEE, 1987
- Test Schedules for VLSI Circuits Having Built-In Test HardwareIEEE Transactions on Computers, 1986
- An Automatic DFT System for the Silc Silicon CompilerIEEE Design & Test of Computers, 1986
- A Knowledge-Based System for Designing Testable VLSI ChipsIEEE Design & Test of Computers, 1985