XANES spectroscopy using high-resolution resonant Raman scattering: application to holmium
- 1 January 1992
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 4 (3) , 879-886
- https://doi.org/10.1088/0953-8984/4/3/027
Abstract
The use of resonant Raman scattering at X-ray energies for studies of the near-edge structure of the absorption edge is presented. The potential of the method is shown in the case of the Ho LIII-edge, which is measured using Cu K alpha 1 radiation and a focusing crystal spectrometer. The results are interpreted within a model where the density of final electron states is constant plus a narrow band where the density is high (white line). A comparison with the other methods used in X-ray absorption near-edge structure spectroscopy is also given.Keywords
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