Influence of surface roughness on measuring depth profiles and the total amount of implanted ions by RBS and ERDA
- 1 March 1998
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 136-138, 628-632
- https://doi.org/10.1016/s0168-583x(97)00798-2
Abstract
No abstract availableKeywords
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