Effects of surface roughness on backscattering spectra
- 15 January 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 168 (1-3) , 163-167
- https://doi.org/10.1016/0029-554x(80)91247-1
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Surface Roughness Using Rutherford BackscatteringIEEE Transactions on Nuclear Science, 1979
- Measurement of oxygen and nitrogen profiles in steelNuclear Instruments and Methods, 1978
- Tilting angle dependence of Rutherford backscattering: Uniformity of near surface layersNuclear Instruments and Methods, 1978
- The optimization of a rutherford backscattering geometry for enhanced depth resolutionNuclear Instruments and Methods, 1975
- Backscattering measurements and surface roughnessNuclear Instruments and Methods, 1974
- Some general features of random elastic scattering spectraThin Solid Films, 1973