Latchup Paths in Bipolar Integrated Circuits
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 33 (6) , 1499-1504
- https://doi.org/10.1109/TNS.1986.4334630
Abstract
A combination of experimental techniques was used to find latchup paths in bipolar circuits. Voltage contrast scanning electron microscopy was applied as an internal probe to analyze latchup paths. Data obtained on six device types show a variety of path combinations and interactions responsible for latchup.Keywords
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