Arsenic Clustering in Silicon
- 1 July 1971
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 42 (8) , 3195-3200
- https://doi.org/10.1063/1.1660706
Abstract
Large decreases in the conductivity of arsenic‐doped silicon have been observed during 500–970°C heat treatments. The rate of conductivity change depends upon the prior quenching rate from diffusion temperature to room temperature. These conductivity changes are reversed by higher‐temperature treatments. The relationship between the electrically active arsenic, as calculated from the conductivity, and the total arsenic is shown to be consistent with a model of substitutional arsenic atoms being nonionized when in a cluster or in a complex involving one or more vacancies.This publication has 4 references indexed in Scilit:
- A STUDY OF DIFFUSED LAYERS OF ARSENIC AND ANTIMONY IN SILICON USING THE ION-SCATTERING TECHNIQUEApplied Physics Letters, 1970
- Silicon Defect Structure Induced by Arsenic Diffusion and Subsequent Steam OxidationIBM Journal of Research and Development, 1970
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962
- Solid Solubilities of Impurity Elements in Germanium and Silicon*Bell System Technical Journal, 1960