A time-of-flight secondary ion mass spectrometry study of sequential polymers with a well-defined segmental length
- 31 July 2001
- Vol. 42 (16) , 6841-6849
- https://doi.org/10.1016/s0032-3861(01)00153-7
Abstract
No abstract availableKeywords
This publication has 25 references indexed in Scilit:
- Quantitative Surface Analysis of Ethylene-Propylene Polymers using ToF-SIMSSurface and Interface Analysis, 1997
- Surface Segregation in Blends of Polystyrene and Perfluorohexane Double End Capped Polystyrene Studied by Static SIMS, ISS, and XPSMacromolecules, 1996
- Combined Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy Study of the Surface Segregation of Poly(methyl methacrylate) (PMMA) in Bisphenol A Polycarbonate/PMMA BlendsMacromolecules, 1995
- Surface morphology studies of multiblock and starblock copolymers of poly(.alpha.-methylstyrene) and poly(dimethylsiloxane)Macromolecules, 1993
- X-ray photoelectron and static secondary-ion mass spectroscopic studies of segmented block copoly(ether-ester)sPolymer, 1991
- Analysis of polymer surfaces by SIMS. Part 14. Aliphatic hydrocarbons revisitedSurface and Interface Analysis, 1990
- Surface characterization of butyl methacrylate polymers by XPS and static SIMSSurface and Interface Analysis, 1990
- Static SIMS study of miscible blends of polystyrene and poly(vinyl methyl ether)Surface and Interface Analysis, 1990
- Surface characterization of a poly(styrene/p-hydroxystyrene) copolymer series using x-ray photoelectron spectroscopy, static secondary ion mass spectrometry, and chemical derivatization techniquesJournal of Vacuum Science & Technology A, 1990
- The time of flight static secondary negative ion mass spectra of poly(methylmethacrylate), poly(ethylmethacrylate), and poly(methylmethacrylate‐co‐ethylmethacrylate). Ion structures and quantificationJournal of Polymer Science Part B: Polymer Physics, 1989