Structural properties of the PdSi interface: An investigation by reflection high energy electron diffraction
- 1 November 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 97 (4) , 295-300
- https://doi.org/10.1016/0040-6090(82)90521-1
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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