On the ‘excess white noise’ in MOS transistors

This publication has 11 references indexed in Scilit:

• On the high frequency excess noise and equivalent circuit representation of the MOS-FET with n-type channel
  Solid-State Electronics, 1969
• Theory and experiments of low-frequency generation-recombination noise in MOS transistors
  IEEE Transactions on Electron Devices, 1969
• Low frequency noise in MOS transistors—I Theory
  Solid-State Electronics, 1968
• Test of the thermal-noise hypothesis in m.o.s.f.e.t.s
  Electronics Letters, 1968
• Surface states and 1/f noise in MOS transistors
  IEEE Transactions on Electron Devices, 1967
• Evidence of the Surface Origin of the1fNoise
  Physical Review Letters, 1966
• The effects of fixed bulk charge on the thermal noise in metal-oxide-semiconductor transistors
  IEEE Transactions on Electron Devices, 1966
• The effects of fixed bulk charge on the characteristics of metal-oxide-semiconductor transistors
  IEEE Transactions on Electron Devices, 1966
• Theory of noise in metal oxide semiconductor devices
  IEEE Transactions on Electron Devices, 1965
• Observation of Impurity Redistribution During Thermal Oxidation of Silicon Using the MOS Structure
  Journal of the Electrochemical Society, 1965