Magnetic Force Microscopy (MFM)
- 1 January 1992
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 90 references indexed in Scilit:
- Contact electrification using force microscopyPhysical Review Letters, 1989
- Deposition and imaging of localized charge on insulator surfaces using a force microscopeApplied Physics Letters, 1988
- High-resolution capacitance measurement and potentiometry by force microscopyApplied Physics Letters, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Observation of magnetic forces by the atomic force microscopeJournal of Applied Physics, 1987
- Atomic Resolution with Atomic Force MicroscopeEurophysics Letters, 1987
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic force microscope–force mapping and profiling on a sub 100-Å scaleJournal of Applied Physics, 1987
- Tunneling experiments involving magnetic tip and magnetic sampleZeitschrift für Physik B Condensed Matter, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986