Contrast of a Stacking Fault on X‐Ray Topographs
- 1 January 1968
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 27 (1) , 77-93
- https://doi.org/10.1002/pssb.19680270107
Abstract
The contrast of the image of a stacking fault on a section topograph is discussed in detail. The intensity distribution of the X‐rays reflected by a crystal containing a stacking fault is the sum of three terms: the first one is due to interferences between waves which have suffered no interbranch scattering, the third term is a cross term due to interferences between waves of both types. The latter is shown to be the predominant term when the crystal is absorbing. This is confirmed by experiment. The derivation has been done using Kato's spherical wave approach and the stationary phase method. The expressions are given for an absorbing crystal and an asymmetrical orientation of the reflecting planes and the stacking fault with respect to the crystal faces. There is good agreement between the calculated intensity distribution and that observed in the image of a stacking fault.Keywords
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