X‐Ray Dynamical Contrast of a Planar Defect
- 1 January 1968
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 26 (2) , 469-484
- https://doi.org/10.1002/pssb.19680260211
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
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- Direct observations of plane wave and spherical wave Pendellösung fringesPhysica Status Solidi (b), 1968
- Some Recent Applications of X-Ray TopographyPublished by Springer Nature ,1967
- The X-Ray Diffraction Image of a Stacking FaultPublished by Springer Nature ,1967
- Étude de la distribution des déformations observables sur les topographies par rayons X de cristaux presque parfaitsJournal de Physique et le Radium, 1966
- A New Type of X-Ray Pendellösung Fringes Observed in a Parallel-Sided Quartz Single CrystalJapanese Journal of Applied Physics, 1965
- Elastic strain and coloration pattern in natural quartz crystalsThe European Physical Journal A, 1965
- X-ray Topographic Study on Stacking Faults in Silicon Single CrystalsJapanese Journal of Applied Physics, 1964
- X-Ray Analysis of Stacking Fault Structures in Epitaxially Grown SiliconJournal of Applied Physics, 1963
- X-Ray Observations of Lattice Defects in Particular, Stacking Faults in the Neighbourhood of a Twin Boundary in Silicon Single CrystalsJournal of the Physics Society Japan, 1962