An Automated System for De-Embedded Measurements of Noise and Gain Parameters
- 1 June 1987
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- On the Noise Parameters of Isolator and Receiver with Isolator at the Input (Short Paper)IEEE Transactions on Microwave Theory and Techniques, 1986
- Characterization of GaAs FET's in Terms of Noise, Gain, and Scattering Parameters through a Noise Parameter Test SetIEEE Transactions on Microwave Theory and Techniques, 1984
- Measurement of Losses in Noise-Matching NetworksIEEE Transactions on Microwave Theory and Techniques, 1981
- A microwave noise and gain parameter test setPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978