Temperature Dependence of theX-Ray Emission Edge of Li
- 21 February 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 38 (8) , 442-445
- https://doi.org/10.1103/physrevlett.38.442
Abstract
The x-ray emission spectrum of Li has been measured with 0.1-eV resolution for temperatures between 85 and 490 K. A prominent shoulder is observed on the emission edge that is strongly broadened and shifted in energy as the temperature is raised. The peak in the emission spectrum lies about 0.6 eV below this shoulder. The steep high-energy edge of the spectrum is interpreted as a Fermi edge centered at 54.8 eV and having a width of 0.2 eV. The results are compared with similar structure observed in the absorption spectrum of Li.
Keywords
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