In Situ Studies of the Microstructure of a Si:H Surfaces and Interfaces
- 1 January 1986
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The nucleation and growth of glow-discharge hydrogenated amorphous siliconJournal of Applied Physics, 1986
- A spectroscopic ellipsometry study of the nucleation and growth of plasma-deposited amorphous siliconThin Solid Films, 1985
- Optical properties of thin filmsThin Solid Films, 1982
- Surface analysis during vapour phase growthJournal of Crystal Growth, 1980
- Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometersJournal of the Optical Society of America, 1974