Comparison of calculated noise figures from the parameters of a JFET with measured total noise figures
- 31 December 1967
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 10 (12) , 1221-1222
- https://doi.org/10.1016/0038-1101(67)90065-2
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Thermal noise in junction-gate field-effect transistorsIEEE Transactions on Electron Devices, 1966