Signal/background ratio of ionization edges in EELS

This publication has 7 references indexed in Scilit:

• Thickness dependence of signal/background ratio of inner-shell electron excitation loss in eels
  Ultramicroscopy, 1984
• Correcting electron energy loss spectra for artefacts introduced by a serial data collection system
  Journal of Microscopy, 1984
• Scattering angle dependence of signal/background ratio of inner-shell electron excitation loss in eels
  Ultramicroscopy, 1983
• On some aspects of energy losses studies in electron microscopy up to H.V.E.M.
  Micron (1969), 1980
• A simple electron spectrometer for energy analysis in the transmission microscope
  Ultramicroscopy, 1978
• Contribution of electron energy loss spectroscopy to the development of analytical electron microscopy
  Ultramicroscopy, 1976
• Inelastic scattering of 80 keV electrons in amorphous carbon
  Philosophical Magazine, 1975