The intersecting Kikuchi line technique; critical voltage at any voltage
- 1 January 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 17 (4) , 329-334
- https://doi.org/10.1016/0304-3991(85)90199-8
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Quantitative analysis of CBED to determine polarity and ionicity of ZnS-type crystalsActa crystallographica Section B, Structural science, crystal engineering and materials, 1984
- Determination of crystal structure factors of Si by the intersecting-Kikuchi-line methodActa Crystallographica Section A, 1979
- The critical voltage effect in high voltage electron microscopyPhilosophical Magazine, 1972
- The application of non-systematic many-beam dynamic effects to structure factor determinationActa Crystallographica Section A, 1971
- A new method of determining the atom form factor by high-voltage electron diffraction. An application of the effect of vanishing of the second-order reflexionActa Crystallographica Section A, 1968
- An apparent variation of structure factors for electrons with the accelerating voltage. An observation through Kikuchi patternsActa Crystallographica Section A, 1968