The effect of growth defects on the X-ray reflectivity of multilayer systems
- 1 April 1994
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 74 (4) , 315-321
- https://doi.org/10.1016/0169-4332(94)90113-9
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Wetting properties of thin liquid polyethylene propylene filmsPhysical Review Letters, 1993
- Fourier Reconstruction of Density Profiles of Thin Films Using Anomalous X-Ray ReflectivityEurophysics Letters, 1993
- Quantitative X-Ray Diffraction From SuperlatticesMRS Bulletin, 1992
- Analysis of neutron reflectivity data: maximum entropy, Bayesian spectral analysis and speckle holographyPhysica B: Condensed Matter, 1991
- Complete wetting of a rough surface: An x-ray studyPhysical Review Letters, 1991
- X-ray-scattering study of capillary-wave fluctuations at a liquid surfacePhysical Review Letters, 1991
- Determination of roughness correlations in multilayer films for x-ray mirrorsJournal of Applied Physics, 1991
- X-Ray Scattering Studies of Multilayer InterfacesMRS Proceedings, 1991
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954