X-ray absorption near-edge structure and extended x-ray absorption fine-structure investigation of Pd silicides
- 15 July 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 32 (2) , 612-622
- https://doi.org/10.1103/physrevb.32.612
Abstract
X-ray absorption spectroscopy is used to investigate the near-L-edge structures of Pd in pure Pd and bulk Si and PdSi silicides. Possible many-body effects are suggested to explain the apparent discrepancy between the occurrence of ,3 white lines and the 4d hole filling in Pd silicides. The interpretations of the extended fine structures and of the near-edge features are correlated with each other in order to find common support for a dynamical relaxation model for the ,3 deep core holes of Pd silicides.
Keywords
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