An accurate measurement technique for line properties, junction effects, and dielectric and magnetic material parameters
- 1 March 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 37 (3) , 598-605
- https://doi.org/10.1109/22.21633
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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