Chemisorption processes of transition metals Ti, Cr, and Fe on a Si(111) surface
- 15 October 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 36 (12) , 6390-6395
- https://doi.org/10.1103/physrevb.36.6390
Abstract
The chemisorption of transition-metal atoms on the Si surface is of considerable importance in silicide formation. Many experimental studies have indicated quite different formation processes for refractory transition metals and near-noble transition metals. Some studies of the growth of titanium on clean silicon surfaces have led to controversial results as to the reactivity of the interface at room temperature. The authors present theoretical studies on forces acting on metal atoms (Ti, Cr, Fe) in the system by using the self-consistent linear combination of atomic orbitals Xα force method. Results show that the Ti atom has a higher barrier at the surface than the Cr atom. The Ti atom tends to break the Si—Si bond rather more strongly than Cr and Fe atoms do. These behaviors are consistent with recent experimental results. The bonding properties between adatoms and the substrate were analyzed to explain the different force behaviors among transition metals.
Keywords
This publication has 15 references indexed in Scilit:
- Initial growth of Ti on SiPhysical Review B, 1986
- Ti-Si mixing at room temperature: A high resolution ion backscattering studySurface Science, 1985
- Chemical and structural aspects of reaction at the Ti/Si interfacePhysical Review B, 1984
- ELS study on the initial stage of Ti-silicide formation on Si(1 1 1) at room temperatureSolid State Communications, 1984
- Low-temperature diffusion of dopant atoms in silicon during interfacial silicide formationPhysical Review B, 1984
- The adsorption of Ag on the Si(111) 7×7 surface at room temperature studied by medium energy ion scattering, LEED and AESSurface Science, 1984
- Silicide and Schottky barrier formation in the Ti-Si and the Ti-SiOx -Si systemsJournal of Applied Physics, 1982
- Interface metallurgy and electronic properties of silicidesJournal of Vacuum Science and Technology, 1981
- Refractory silicides for integrated circuitsJournal of Vacuum Science and Technology, 1980
- Formation of vanadium silicides by the interactions of V with bare and oxidized Si wafersApplied Physics Letters, 1973