Charging and reliability effects associated with FED spacers
- 1 May 1999
- journal article
- Published by Wiley in SID Symposium Digest of Technical Papers
- Vol. 30 (1) , 1138-1141
- https://doi.org/10.1889/1.1833970
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Thin MgO layers for effective hopping transport of electronsPhilips Journal of Research, 1996
- Fabrication technologies for microsystems utilizing photoetchable glassMicroelectronic Engineering, 1996
- High Voltage Performance Characteristics of Solid Insulators in VacuumPublished by Elsevier ,1995
- In-situ insulator surface charge measurements in dielectric bridged vacuum gaps using an electrostatic probeIEEE Transactions on Electrical Insulation, 1988