Dielectric Properties of Fluxed Barium Titanate Ceramics with Zirconia Additions

Abstract
BaTiO3 compacts, when fluxed with 2 added to the flux phase as a grain growth inhibitor. TEM analysis revealed a microcrystalline grain‐boundary phase with the ZrO2 resident along the grain boundaries. These samples displayed an essentially flat dielectric profile, low dissipation factors (<2%) over the range 25° to 125°C, a near linear dependence (≅±15%) between 25° and −55°C, and significantly increased voltage stability. X‐ray diffraction analyss of these small‐grained materials indicated a suppression of the tetragonal structure toward a more cubic modification.

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