A Simple Detection Method in Photothermal Deflection Measurements on Thin-Film Semiconductors
- 16 November 1986
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 98 (1) , 279-283
- https://doi.org/10.1002/pssa.2210980131
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Properties of PbSe films preparedby chemical “anorganic” depositionPhysica Status Solidi (a), 1985
- Optical approach to thermopower and conductivity measurements in thin-film semiconductorsApplied Physics Letters, 1984
- Photothermal deflection spectroscopy and detectionApplied Optics, 1981