The effect of non-isoplanatism in micrographs taken with an electron microscope equipped with a field emission gun

Publisher Website

31 December 1985

journal article
Published by Elsevier in Ultramicroscopy

Vol. 16 (1) , 47-57
https://doi.org/10.1016/s0304-3991(85)80007-3

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms
Ultramicroscopy, 1978