Thermal characterization of IGBT power modules
- 1 October 1997
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 37 (10-11) , 1731-1734
- https://doi.org/10.1016/s0026-2714(97)00150-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Temperature behavior of insulated gate transistor characteristicsSolid-State Electronics, 1985
- Thermal characterization of power transistorsIEEE Transactions on Electron Devices, 1976