Image force effects in electron microscopy
- 31 December 1985
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 16 (2) , 269-272
- https://doi.org/10.1016/0304-3991(85)90082-8
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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- Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitationsPhilosophical Magazine A, 1978
- Image force for a fast particleSurface Science, 1977
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