Risk assessment for heavy ions of parts tested with protons
Open Access
- 1 December 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (6) , 2311-2314
- https://doi.org/10.1109/23.659052
Abstract
An internuclear cascade-evaporation code is used to model energy deposition in thin slabs of silicon. This model shows that protons produce a significant number of events with effective Linear Energy Transfer (LET) greater than 8 MeV cm/sup 2//mg and demonstrates that proton testing of microelectronic components can be an effective way to screen devices for low Earth orbit susceptibility to heavy ions.Keywords
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