Epitaxy in the Presence of Very Large Misfit: High Resolution TEM Study of Al/Si, Ag/Si, Al/CaF2/Si and Ag/CaF2/Si
- 1 January 1987
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Lattice match: An application to heteroepitaxyJournal of Applied Physics, 1984
- Loss of Coherency of Precipitates in Al-Si: An Hvem StudyProceedings, annual meeting, Electron Microscopy Society of America, 1982
- Silicon/insulator heteroepitaxial structures formed by vacuum deposition of CaF2 and SiApplied Physics Letters, 1982
- Heteroepitaxial Semiconductors for Electronic DevicesJournal of the Electrochemical Society, 1979
- Heteroepitaxial Semiconductors for Electronic DevicesPublished by Springer Nature ,1978