Recording of mass thickness in scanning transmission electron microscopy
- 1 January 1976
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 2, 297-301
- https://doi.org/10.1016/s0304-3991(76)91742-3
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Electronmicroscopic mass determination using photographic isodensity techniquesUltramicroscopy, 1976
- Imaging of crystalline substances in scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Measurement of the top bottom effect in scanning transmission electron microscopy of thick amorphous specimensJournal of Microscopy, 1974
- The display of information from scanned measuring systems by contour mappingJournal of Physics E: Scientific Instruments, 1969
- Messungen und Berechnungen zum elektronenmikroskopischen Streukontrast für 17 bis 1200 keV-ElektronenZeitschrift für Naturforschung A, 1968
- A Photometric Procedure for Weight Determination of Submicroscopic Particles Quantitative Electron MicroscopyJournal of Applied Physics, 1962
- Zur Brauchbarkeit der Bornschen Näherung bei der Berechnung der Elektronenstreuung für den Bereich der ElektronenmikroskopieThe Science of Nature, 1962
- Zur Streuung mittelschneller Elektronen in kleinste WinkelZeitschrift für Naturforschung A, 1954