Evaluation of the probing profile of scanning force microscopy tips
- 30 April 1994
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 53 (4) , 371-380
- https://doi.org/10.1016/0304-3991(94)90050-7
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- A scanning force microscopy study on the morphology of elastomer-coagent blendsPolymer, 1993
- Atomic-force microscopy of gel-drawn ultrahigh-molecular-weight polyethyleneMacromolecules, 1993
- Atomic force microscopy on polymers and polymer related compoundsPolymer Bulletin, 1992
- Raman spectra of zinc phthalocyanine monolayers adsorbed on glassy carbon and gold electrodes by application of a confocal Raman microspectrometerJournal of Electroanalytical Chemistry, 1992
- Imaging steep, high structures by scanning force microscopy with electron beam deposited tipsSurface Science, 1992
- Manipulation of proteins on mica by atomic force microscopyLangmuir, 1992
- Surface pore structures of micro- and ultrafiltration membranes imaged with the atomic force microscopeJournal of Membrane Science, 1992
- Conversion of single crystal mats to ultrahigh modulus polyethylene: the formation of a continuous crystalline phasePolymer, 1989
- Atomic Force MicroscopePhysical Review Letters, 1986
- Ultradrawing of high‐molecular‐weight polyethylene cast from solution. II. Influence of initial polymer concentrationJournal of Polymer Science: Polymer Physics Edition, 1981