Instrumental developments in total reflection x-ray fluorescence analysis for K-lines from oxygen to the rare earth elements

This publication has 30 references indexed in Scilit:

• X-ray fluorescence analysis using synchrotron radiation
  TrAC Trends in Analytical Chemistry, 1989
• Synchrotron radiation excited x-ray fluorescence analysis using total reflection of x-rays
  Analytical Chemistry, 1986
• The Application of Linear Polarized X-Rays after Bragg Reflection for X-Ray Fluorescence Analysis
  Published by Springer Nature ,1985
• Total Reflectance X-Ray Spectrometry
  Published by Springer Nature ,1985
• Energy dispersive X-ray fluorescence analysis with synchrotron radiation
  Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
• X-ray fluorescence analysis in the ng region using total reflection of the primary beam
  Spectrochimica Acta Part B: Atomic Spectroscopy, 1980
• An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level
  Analytical and Bioanalytical Chemistry, 1978
• Total-reflection x-ray fluorescence spectrometric determination of elements in nanogram amounts
  Analytical Chemistry, 1975
• A method for quantitative X-ray fluorescence analysis in the nanogram region
  Nuclear Instruments and Methods, 1974
• Optical Flats for Use in X-Ray Spectrochemical Microanalysis
  Review of Scientific Instruments, 1971