In situ YBa2Cu3O7−x superconductor films on GaAs/AlAs superlattices

Abstract
Superconducting YBa2Cu3O7−x films have been deposited in situ onto III‐V superlattice substrates. The substrates were GaAs/AlAs superlattices grown by molecular beam epitaxy onto GaAs substrates. For 5000‐Å ‐thick YBCO films grown at 615 °C substrate temperature, we have obtained Tc of 73 K. For thinner films the Tc’s are lower, indicating poor interfaces. However, the onset of the superconducting transition is 90 K in all cases. X‐ray diffraction, scanning electron microscopy, and transmission electron microscopy (TEM) show these films to be polycrystalline. TEM shows an interaction layer of about 1000 Å at the interface. Low‐temperature cathodoluminescence measurements of the substrate show that atomic interdiffusion has intruded at least 5000 Å below the interface.

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