Ellipsometrical determination of barrier thicknesses of metal-insulator-metal tunnel junctions
- 1 April 1973
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 12 (7) , 615-619
- https://doi.org/10.1016/0038-1098(73)90298-6
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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