Time-resolved x-ray study of Ge during pulsed laser melting
- 23 May 1988
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 52 (21) , 1785-1787
- https://doi.org/10.1063/1.99625
Abstract
Nanosecond resolution time-resolved x-ray diffraction has been used to make the first measurements of the liquid-solid interface overheating and undercooling in germanium. The results show an orientation-dependent undercooling for growth on (111) and (001) faces. For both the (111) and (001) faces the velocity versus temperature interface response function has a slope of ∼5 K/(m/s), except for undercooling on the (111) face where the slope is 20 K/(m/s).Keywords
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