Debye temperatures and cohesive properties

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Abstract
Values of crystalline-solid Debye temperatures depend both on the method and temperature of measurement. Simple relationships between Debye temperatures and such cohesive properties as compressibility and melting point were derived over 60 years ago by Madelung, by Einstein, and by Lindemann. Debye temperatures ΘXR of a number of piezoelectric semiconductors with chalcopyrite structure have been determined at room temperature by x-ray diffraction. A new series of heat capacity measurements over the temperature range 1.2–40 °K, for four chalcopyrites, give ΘD values at 0 °K. A common proportionality is found between each of these ΘXR and ΘD values and microhardness, and also melting point: Acceptable reproducibility is given for the AIBIIICVI2 chalcopyrites and, separately, the AIIBIVCV2 compounds. Values of Θ are predicted for 15 additional chalcopyrites. Excellent proportionality between Θelastic and compressibility is found for the europium chalcogenides, based on the data of Shapira and Reed.