Stable-Unstable Phase Transition of Densely Contract-Electrified Electrons on Thin Silicon Oxide
- 1 December 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (12B) , L1852
- https://doi.org/10.1143/jjap.32.l1852
Abstract
Using reproducible and controllable contact electrification, we studied the charge dissipation of densely deposited electrons on a thin silicon oxide surface by electrostatic force measurement using a modified atomic force microscope. As a result, by increasing the density of contact-electrified electrons, we observed an appearance of a stable state of the contact-electrified electrons and its disappearance due to charge dissipation, i.e., a kind of stable-unstable phase transition. We also observed saturation of the deposited electron density with the spatial spread of deposited electrons.Keywords
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