Observation of single charge carriers by force microscopy
- 17 December 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 65 (25) , 3162-3164
- https://doi.org/10.1103/physrevlett.65.3162
Abstract
The scanning force microscope is used to deposite charge carriers on insulating films and to monitor their recombination. The charge decay shows up as a discontinuous staircase, demonstrating single-carrier resolution. The decay is found to be controlled by thermionic emission.
Keywords
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