Understanding magnetic force microscopy
- 1 October 1990
- journal article
- research article
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 80 (3) , 373-383
- https://doi.org/10.1007/bf01323519
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- A differential interferometer for force microscopyReview of Scientific Instruments, 1989
- Scanning force microscopy using a simple low-noise interferometerApplied Physics Letters, 1989
- Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]Applied Physics Letters, 1988
- Force microscope using a fiber-optic displacement sensorReview of Scientific Instruments, 1988
- Investigation of Bloch wall fine structures by magnetic force microscopyJournal of Microscopy, 1988
- Calculation of the Bloch wall contrast in magnetic force microscopyJournal of Microscopy, 1988
- Atomic force microscopy using optical interferometryJournal of Vacuum Science & Technology A, 1988
- Observation of magnetic forces by the atomic force microscopeJournal of Applied Physics, 1987
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Atomic Force MicroscopePhysical Review Letters, 1986