Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]
- 12 December 1988
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 53 (24) , 2400-2402
- https://doi.org/10.1063/1.100425
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Atomic Force MicroscopePhysical Review Letters, 1986
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- The measurement of van der Waals dispersion forces in the range 1.5 to 130 nmProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1972